X-RAY DIFFRACTION STUDY ON HIGHLY ORDERED MESOSTRUCTURED THIN FILMS, T. Noma, H. Miyata, K. Takada, A. Iida, pp. 359-364

A continuous mesostructured silica film with uniaxially aligned hexagonal mesochannels is obtained on a silica glass substrate using a rubbing -treated thin polyimide coating on the substrate. The mesochannels in the film are aligned perpendicular to the rubbing direction. To analyze the mesostructured thin films we used a conventional line-focus x-ray diffraction and a two-dimensional (2-D) X-ray diffraction using a synchrotron X-ray microbeam. The diffraction patterns were changed coincident with the sample rotation, which revealed the anisotropy of the mesostructures. 2-D diffraction seems to be the best way to investigate the anisotropy of the mesostructures. While conventional X-ray diffraction is useful to find out the mesochannels alignment. The divergence of the X-ray beam sometimes generates the extra reflections concerning the reciprocal lattice points that were not on the diffraction plane.